3D view shows segmentation of pores (red) and high-density minerals titanomagnetite and ilmenite (yellow) in chips of dolerite within concrete
Sample courtesy of Giacomo Torelli, University of Sheffield, UK

Advanced Solutions for Engineering Materials

Enhance Your EPSRC Strategic Infrastructure Funding Application

Unlock funding opportunities with cutting-edge microscopy. Let’s discuss how ZEISS can support your application.

Unlocking the full potential of current and future engineering materials starts with a deep understanding of their microstructure. Our microscopy solutions enable comprehensive analysis by combining morphological, chemical, and physical property studies, providing a complete picture of material behavior at the microscopic level. Read on to learn more about our solutions and contact us to explore how we can support your application.

Case Studies: Advancing Research with ZEISS Microscopy

Discover how our cutting-edge microscopy solutions are driving innovation in engineering materials research.
Upscaling of internal 4×ROI 5 µm voxel size scan data to larger field of view 0.4 ×28 µm voxel size scan in dolerite concrete (sample 3). Internal tomography of targeted ROI scan shown in bright colours in A and B. Using DeepScout improves the contrast between different constituents, the visibility and identification of small grains within the matrix, and the outline and features within high-density grains (C and D).

Analysis of Concretes and Cements Using AI-enhanced X-ray Microscopy

The Global Cement and Concrete Association (GCCA) reports that over 14 billion cubic meters of concrete and more than 4 billion tonnes of cement are produced annually, highlighting the need for detailed study of these critical load-bearing materials to ensure optimal performance and safety.  X-ray microscopy (XRM), a non-destructive 3D imaging technique, is transforming the analysis of concrete and cement by enabling the classification of grains, particles, interfaces, and pores at various scales, thus enhancing the understanding of their physical and compositional properties. A significant focus in XRM is on improving data acquisition and processing for accurate segmentation, which is crucial for quantifying different minerals or phases within these materials.

Advances in reconstruction techniques, particularly those utilizing AI algorithms, are addressing challenges in segmenting complex cement and concrete microstructures by reducing artefacts and noise, improving throughput, and facilitating the upscaling of high-resolution data. This study applied three AI and machine-learning-based reconstruction approaches—DeepRecon Pro, DeepScout, and Mineralogic 3D—to various cement and concrete samples, demonstrating enhanced mineral classification and quantification capabilities​.

EBSD map of the microstructure in Euler contrast

Time-resolved In-situ Tensile Testing and EBSD Mapping of Steel​

Tensile testing is crucial for characterising the mechanical properties of metals, and combining it with imaging techniques provides valuable insights into material deformation. This study utilizes the In Situ Lab for ZEISS FE-SEMs to conduct high-temperature tensile tests on steel samples while monitoring deformation progression through secondary electron (SE) and electron backscatter diffraction (EBSD) imaging. By correlating SE and EBSD data, high Schmid factor grains, which significantly contribute to deformation, can be identified, with their crystallographic orientations changing due to dislocation movement.

The results reveal local plastic events in single grains, with high Schmid factor grains responsible for most plastic deformation, even up to strains of 15%. This in situ testing method proves to be a powerful tool for materials science, providing detailed data along the stress-strain curve while minimising the need for multiple experiments and conserving sample material.

ZEISS Microscopy Solutions for Engineering Materials

Explore our recommended microscopy solutions for engineering materials, designed to meet EPSRC application criteria. This is not an exhaustive list—contact us to discuss your specific needs.
  • ZEISS VersaXRM 730

    ZEISS VersaXRM 730 provides more flexibility than any other advanced X-ray microscope on the market. It delivers breakthrough resolution performance, enhances accessibility with an intuitive user experience, and boosts productivity with faster throughput and reduced time-to-results.

  • ZEISS Crossbeam Laser

    Achieve massive material ablation and large-sample preparation with precision. The femtosecond laser on the airblock enhances in situ studies, prevents chamber contamination, and is configurable with Crossbeam 350 and 550. Gain rapid access to deeply buried structures and prepare extremely large or high-aspect-ratio features, such as atom probes, with ease.

  • ZEISS GeminiSEM 560

    GeminiSEM 560 sets a new standard for surface-sensitive, distortion-free, high-resolution imaging, enabling effortless imaging below 1 kV. With the introduction of Gemini 3 and its advanced electron optical engine, Smart Autopilot, it delivers the highest resolution in the GeminiSEM family under all working conditions.

Contact Us

Interested in support for an EPSRC Strategic Infrastructure call application involving a ZEISS solution, or have questions? Complete the form below, and a representative will get in touch.

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    • Calibration Procedure for Finding Suitable Milling Parameters on ZEISS Crossbeam laser 50 μm

      1 MB
    • Engineering Materials: Metals and Alloys

      3 MB
    • Enabling Premium 3D Crystallographic Imaging in Your Laboratory

      6 MB
    • Observing Fracture Mechanics

      887 KB
    • Non-destructive Microstructural Characterization of Thermal Barrier Coating (TBC)

      3 MB


    • Extending the Frontiers of Semiconductor Failure Analysis

      ZEISS Versa 3D X-ray Microscope Family

      1 MB
    • LabDCT Pro on ZEISS VersaXRM 730

      Product Accessories

      4 MB
    • Perfect Tomographies. Every sample. Every user. Every time.

      ZEISS VersaXRM 730

      1 MB
    • ZEISS Versa X-ray Microscope Offerings

      679 KB
    • ZEISS Crossbeam Family

      Your FIB-SEM for High Throughput 3D Analysis and Sample Preparation

      7 MB
    • ZEISS GeminiSEM

      Your Field Emission SEMs for the Highest Demands in Imaging and Analytics from Any Sample

      17 MB
    • ZEISS Sense BSD

      Backscatter Electron Detector for Fast and Gentle Ultrastructural Imaging

      6 MB
    • cECCI for ZEISS FE-SEM (Flyer)

      Controlled Electron Channeling Contrast Imaging on ZEISS GeminiSEM

      1 MB