9th March 2021, 12:00 - 13:00

Nuclear energy production critically depends on the reliable performance of a wide variety of materials working in concert under unique and often extreme operating conditions. Understanding and optimizing this performance, qualifying materials, and preventing premature failure similarly depends on a comprehensive understanding of these materials at the microstructural level. Due to the characteristics of the materials used, however, analyzing materials for nuclear energy production presents unique challenges. In this talk we will discuss some of the unique solutions that enable characterization of these materials with advanced microscopy techniques, including electron, ion, and x-ray microscopy, and present some examples highlighting novel characterization workflows enabled by these capabilities.

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Dr. Ben Tordoff

Head of Materials Science, ZEISS Research Microscopy Solutions

Dr. Ben Tordoff is the head of materials science at ZEISS Research Microscopy Solutions based at the global headquarters in Oberkochen, Germany. Driven by an interest in multimodal and multiscale analytical microscopy, Ben has held several positions over his decade long time at ZEISS and currently drives strategy related to artificial intelligence, correlative microscopy and multiscale imaging and analysis across a broad range of materials science challenges. As part of his role, he also acts as a guest lecturer in analytical microscopy and industrial Ph.D. supervisor at several European universities. Prior to working at ZEISS, Ben spent 5 years at Thermo Fisher Scientific in the analytical technology division.

In 2007, Dr. Tordoff completed his Ph.D. under Prof. Jon Billowes at the University of Manchester, UK in the subject of experimental nuclear physics where he was awarded a Marie Curie scholarship, E.P.S.R.C. studentship and Japan Society for the Promotion of Science (JSPS) scholarship (RIKEN). During his Ph.D., Ben worked on the development of understanding nuclear shapes and sizes far from the region of stability in the Segre chart through laser spectroscopy at JYFL, CERN and ORNL. Prior to this, he completed an MPhys (Hons) in physics with astrophysics at UMIST. Ben lives in Ulm, Germany with his wife and son.

Smail Chalal

Application engineer/FIB/SEM/XRM

Smail Chalal is an application engineer specializing in SEM/FIB and XRM. He has been working at Zeiss for 34 years and started as a service engineer. He joined the application team in 2009. As Part of his occupation he manages special projects within Zeiss France mainly in the nuclear field. Since 2010, eight SEM and FIB nuclearization projects have been carried out with the contribution of Defisystèmes, a French company who modify and design mechanical and electrical parts that are compatible with radioactive environments.

In order to fully meet specific customers’ needs, he has developed advanced skills in programming, namely in Python, C++, C#, and In addition, he has designed specific sample holders and created an In situ STEM detector as well as the hardware and software, In chamber nanoindentor…

After qualifying in electronics (≈HND) in 1978, he worked as a flight engineer on Boeing 727 planes until 1983. In 1984, he began studying engineering at CNAM, Paris, while working as quality control technician on biological systems analysis.