May 17, 2022 | 14:00 – 16:00 CEST

New Applications for Conventional SEM

Virtual Workshop

In this webinar, the recent performance enhancement of the EVO systems and the latest improvements to the EVO application workflows will be discussed and demonstrated. In addition to the correlative solution workflows, the ease of use of additional and complementary software such as SmartSEM Touch and ZEN will be shown.

We first demonstrate the Correlative Imaging principle where Images from different microscopes are correlated together to give an even more insightful understanding of the sample. Subsequently, we will also demonstrate how to greatly improve imaging of non-conductive samples using low kV and Beam Deceleration.

Furthermore, the operation of the next generation of BSD and C2D detectors, with higher quality images, will be demonstrated. The performance of the new Single PC EVOs, with the combined SEM and EDS functionalities, will also be shown during the webinar. An EVO with a single PC offers simplified imaging and analysis solutions to the system operators. The combined system, with its unique enhanced geometry, allows having a new integrated energy and efficient operation of the SEM and EDS, with significantly increased EDS input count.

Easy and intuitive SEM operation

Making your data even more relevant by extending your experiment

Integrated chemical analysis in your workflow

Extreme surface sensitivity with unprecedented low landing energy capabilities

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Program

May 17, 2022 | 14:00 – 16:00 CEST

14:00 Welcome

Veronika Kugler

14:05 New Features: Taking Your Conventional SEM to the Next Level

Antonio Casares

14:30 Virtual Demonstration of Conventional SEM

  • Easy-to-Use Features: SmartTouch
  • Correlation Microscopy and Automated EDS Mapping with ZEN
  • Low Landing Energy Capabilities with EVO

Kenneth Png

15:50 Q&A

Veronika Kugler

16:00 Closing Words

Antonio Casares

Speakers Profiles

Dr. Veronika Kugler

Veronika joined ZEISS in 2004. She currently leads the application team and manages the ZEISS Microscopy Customer Centre, in Cambridge, UK.

She received her MSc in Chemistry in 1997. Afterwards, she held the Visiting Researcher position at the Institute of Physics and Biophysics, at Oslo University, Norway. In 2003, she received her PhD degree in Material Science, at the Institute of Physics and Measurement Technology, at Linköping University, Sweden. Afterwards, she held a Post-Doctoral position at the Department of Earth Sciences, at University of Cambridge, UK.

Her PhD and Post-Doctoral studies focused on understanding the Growth-Microstructure-Property Relationships of thin films of various metal oxide materials, for potential use in piezoelectric sensors, pyroelectric detectors and ferroelectric memory capacitors, or as dielectric layers in the semiconductor industry. She has more than 20 years of experience in using various electron microscopy techniques and application areas.

Dr. Antonio Casares

Antonio Casares is sales and applications specialist at ZEISS Research Microscopy Solutions in Germany. He has more than 25 years of experience in the design and construction of mass spectrometers and electron microscopes and a deep application knowledge in those techniques.
Antonio holds a diploma in biophysics achieved at the University of Giessen, Germany, where he also earned his doctor’s degree, summa cum laude, in “Charged Particle Optics”. Antonio was employed with the Max-Planck Institute as “Aerospace Instrument Scientist” and the Oak Ridge National Laboratory Nuclear Physics Division in the USA before he joined Carl Zeiss Strategic Business Development in August 2002.

Dr. Kenneth Png

Ken works as Applications Engineer at the ZEISS Microscopy Customer Centre in Cambourne UK. He joined ZEISS 12 years ago and specialises in all electron microscopy applications for the EVO and Sigma product range. Before joining Zeiss, he was at the NanoVision SEM Imaging Centre at Queen Mary University of London in the Materials Department. During this time, he managed to publish 31 scientific papers in collaboration with diverse research groups and applications. His highest cited paper is in Nature Protocols where he demonstrated FIB/SEM microscopy on biological tissues.