The emergence of ultra-short pulsed lasers for sample preparation opens new workflow strategies as well as challenges in knowing which approach to use. This talk will give an overview of different sample preparation strategies for high-resolution imaging and analysis, with application examples showcasing new capabilities enabled by a FIB-SEM with integrated fs-laser.
- Introduction to cross-section techniques
- Review of mechanical methods, BIB, FIB-SEM, ex situ USP lasers, integrated laser FIB-SEM
- LaserFIB applications and technique comparisons
Cheryl Hartfield is Product Marketing Manager for ZEISS Microscopy, based in Dublin, California. She received her MA and BS in Microbiology from UT Southwestern Medical Center, and Texas A&M, respectively. She co-founded Omniprobe and was Senior Member of Technical Staff at Texas Instruments, working for 12 years in characterization and package development. Cheryl is an ASM Fellow and Past President of EDFAS. She has 15 patents and authored >70 papers.