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Large field-of-view electron microscopy imaging of 2.5D package interconnects with inset showing high resolution image of a single 20 µm microbump.
Event

Packaging Failure Analysis Workshop

Location: Carl ZEISS Ltd, Lutterworth
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Workshop Overview

Join us for a focused, hands on event dedicated to strengthening the knowledge of failure analysis (FA) capabilities within the electronics packaging community.

This one day programme will bring together practitioners, researchers and engineers to explore the strengths, limitations and practical workflows of the commonly used structural characterisation methods: light microscopy, electron microscopy and X-ray computed tomography (X-ray CT). Through expert-led sessions, live demonstrations and real case studies, attendees will learn how these complementary techniques can be applied to diagnose defects, validate manufacturing processes and improve product reliability.

Designed for both early-career analysts and experienced professionals looking to sharpen their toolkit, the event provides a clear, application-oriented overview of when and how to deploy each technique effectively. Participants will gain insights into sample preparation strategies, imaging artefacts, failure modes commonly encountered in electronics assemblies, and best practice approaches for integrating multi-modal evidence. Whether you work in manufacturing, quality assurance, materials research or product development, this event will equip you with practical, transferable skills to accelerate and improve your failure analysis investigations.  Places are limited, register today to attend.

Why You Should Attend

  • Gain understanding about the challenges in failure analysis of packaging samples
  • Benefit from live demonstrations of keystone equipment, such as light microscopes
  • The opportunity to get insights on your specific challenges from industry experts in FA

Date: 30th April 2026
Time: 09:30 - 15:30 (GMT)
Location: Carl ZEISS Ltd, Lutterworth

Dr. Suzanne Costello
Speaker Dr. Suzanne Costello Founder & CEO, Forensic Eyes.

Dr. Costello graduated from Heriot-Watt University in Edinburgh with a Masters degree in Physics. She went on to achieve an Engineering Doctorate in Microsystems Engineering, specialising in hermeticity test method for microelectronics and MEMS. She then published a book on the subject. With 12 years of industrial experience working in failure analysis, Suzanne founded Forensic Eyes in December 2023.

Dr. Andrew Elliott
Speaker Dr. Andrew Elliott Business Development Product and Applications specialist, Carl Zeiss Ltd.

Andrew Elliott is the Business Development and Applications Lead for the Electronics and Materials Science sectors at Carl Zeiss Ltd. He specialises in advanced imaging systems—including light microscopes, electron microscopes, and X‑ray CT—and in translating these technologies into effective failure‑analysis workflows. This expertise positions him well to contribute to the ongoing direction of the NMI Failure Analysis Working Group. Outside his role at ZEISS, Andrew holds a PhD in the metallurgy of gas‑turbine engine materials and a Master’s degree in Chemistry, both from the University of Leicester.

Demonstrator Dr. Paras Shah Senior X-ray CT Applications Engineer, Carl Zeiss Ltd.

Dr. Shah is a Senior X-ray Applications Engineer at Carl Zeiss, bringing significant X-ray CT experience from his PhD in dimensional metrology of additive manufacturing to his work at both MTC and Jaguar Land Rover. Dr. Shah has a broad range of knowledge on X-ray CT applications, including significant experience in optimisation of CT experiments for packaged devices.

Venue

Carl Zeiss Limited

Carl Zeiss Limited Unit 3, Mulberry Enterprise Park, Coventry Road LE17 4WZ Lutterworth United Kingdom
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Workshop Partner IMAPS United Kingdom

We are proud to partner with IMAPS UK,  the United Kingdom Chapter of the International Microelectronics Assembly & Packaging Society – IMAPS. Visit Website

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Workshop Partner Forensic Eyes

We are proud to partner with Forensic Eyes, a multi-disciplinary, technically experienced team who use creativity and critical thinking to resolve challenging problems. Visit Website

Workshop Registration

Fill out this quick form to register your interest in attending and a representative will be in touch to confirm that you have secured a place for the workshop. Places are limited.

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