Composites: The Future of Transportation

Explore this Ceramic Matrix Composite, scanned non-destructively in 3D with ZEISS X-ray Microscopy

As mentioned in the video above, this dataset is a woven composite comprising of carbon fibres in a silicon carbide matrix. The SiC matrix has been applied using chemical vapor infiltration. The sample was scanned non-destructively in 3D using X-ray Microscopy with the ZEISS Xradia Versa. The Scout & Zoom workflow was used to capture data across length scales from the whole sample overview to the highest resolution scan, where it is possible to detect the fibre clusters.

3D deep-dive into the sample with X-ray

Microscopy Sample courtesy of Sandrine Ricote, Colorado School of Mines.

Figure 1 shows the sample overview scanned with the 0.4x objective. Already three distinct phases are visible – C-fibre, SiC and air. Voxel size (a 3D pixel) is 14 microns, so it is not yet possible to see much of the fibre structure.

In Figure 2, the 4x objective of the Xradia Versa has been used, giving a higher resolution image at the expense of field of view. There are still 3 phases, but it is now possible to see some detail in the fibre structure. It can be seen that the CVI method used to implant the SiC has not been entirely successful in coating the C-fibres.

Finally, Figures 3a and 3b show the highest resolution scan, captured using the 20x objective with a voxel size of 0.8 microns. It is now possible to make out individual fibres, along with thin SiC coatings and air voids. With this data an accurate segmentation of the fibre bundles is possible, denoted in orange.

Scanning Technology

High Resolution 3D X-ray Microscopy

Characterize the properties and behaviours of your materials non-destructively.
Reveal details of microstructures in three dimensions (3D).
Develop and confirm models or visualize structural details.
Achieve high contrast and submicron resolution imaging even for relatively large samples.