ZEISS Microscopy

View Applications around Materials Microscopy

Three Videos of Unique Insights

Advanced microscopy methods are offering new perspectives into material compositions and structures. Characterize your samples in three dimensions, across multiple length scales or modalities, and through in situ experiments. These capabilities let you synthesize, control, and observe materials in new ways and offer unique insights into your materials.

Below, please find a collection of short videos which illustrate how microscopy offers these unique insights.

Take a 3D Tour Through the Inside of a 3D Printed Gear Wheel using X-ray Microscopy

Move beyond the traditional surface observation: 3D imaging and analysis techniques lets you explore the role of the subsurface. Utilize nondestructive methods like X-ray microscopy, you can even extend them through the variable of time (4D).


Investigate a Pouch Cell Battery at Multiple Length Scales

This application video shows an excerpt of a multi-modal microscopic investigation of an unused pouch cell type lithium-ion battery. The analysis correlates light and scanning electron microscopy. The foils of an anode (A), a separator (S) and a cathode (K) have been mounted on a 25 mm SEM sample stub.

The first 10 seconds of the video show an overlay image composed of a light microscopic overview image, acquired with ZEISS Axio Imager Vario, overlaid with a detailed image of the cathode foil with an area of 1 mm2, acquired by ZEISS MultiSEM 505, the fastest scanning electron microscope of the world that uses 61 electron beams in parallel. The following sequence shows how you can zoom in from a field of view covering 1 mm2 to a field of view of 10 µm, being able to resolve the cathode material in finest detail. Note that the area covered here consists of more than 15 billion image pixels! The last 10 seconds take the viewer back to the overview image again.
The individual images were acquired using the secondary electron signal at 1keV landing energy with 8 nm pixel size and 400 ns pixel dwell time. Acquisition time for the entire area of ~1 mm² was less than 7 minutes – including stage movement and image stitching. For comparison: a state-of-the-art single beam SEM using the same imaging parameters needs almost 3 hours to acquire the same area.

Sample courtesy: U. Golla-Schindler & T. Bernthaler, IMFAA, Institute for Materials Research, University Aalen.
 


Understand Failures in Composites with in situ Microscopy Experiments

Through in situ microscopy experiments, materials scientists gain the opportunity to directly observe the connections between structure and properties, better understanding phenomena such as how and why failures initiate and propagate.


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